008004 land pattern dimensions for high yield |
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ransonjd
Advanced User Joined: 15 Nov 2016 Status: Offline Points: 139 |
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Posted: 13 Jun 2024 at 7:34am |
I'm going to be using 008004 (0201 metric) capacitors in an ultra-small design.
I'd like to get as high assembly yield as possible, and I was wondering if there were any recommended low-defect land patterns? I've seen a number of papers on 01005 land patterns, but I haven't seen similar for 008004. I want as many data points as I can get. I have requested guidance from my assembler, and Murata provides a recommended range of dimensions.
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ransonjd
Advanced User Joined: 15 Nov 2016 Status: Offline Points: 139 |
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For anyone else looking, I found this IPC APEX presentation from Fuji:
https://www.ipc.org/system/files/technical_resource/E40%26S06_03%20-%20Scott%20Wischoffer.pdf |
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SDTKO
Active User Joined: 11 Dec 2019 Status: Offline Points: 30 |
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The only sane thing to do in this case - as you already figured out - is talking to your assembler. For small chip packages, chances are that generic calculators and general recommendations do more harm than good.
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